Seminar: AFM in SEM, new approach in microscopy and story of Czech young Spin-off.

Jan Neuman

20th of February 14:00, in CH4

Czech Republic is well known for the development of scientific instrument especially in Electron microscopy field. NenoVision is young Czech spin-off who brought to the market innovation AFM add on for SEM microscopes. In the talk, we will explain the advantages of the AFM/SEM integrations on several application examples. A unique technique for correlative imaging CPEM will be presented and described. Part of the talk will also devote the spin-off formation and technology company founded with all issues, challenges and expectations. Everybody is welcome to discuss how to transfer technology from the University to Business environment.