Publication

A. C. Bidulock, P. Dubský, A. den Berg, and J. C. Eijkel,
Integrated internal standards: A sample prep-free method for better precision in microchip CE

Electrophoresis, 40(5), 756-765, 2018

DOI, BibTeX

Reference

@article{Bidulock2018,
  author = "A. C. Bidulock and P. Dubský and A. den Berg and J. C. Eijkel",
  title = "Integrated internal standards: A sample prep-free method for better precision in microchip {CE}",
  year = 2018,
  journal = "Electrophoresis",
  publisher = "Wiley",
  volume = 40,
  number = 5,
  pages = "756-765",
  month = "Dec",
  doi = "10.1002/elps.201800393",
  url = "https://doi.org/10.1002%2Felps.201800393"
}