Journal Articles by A. C. Bidulock
A. C. Bidulock,
P. Dubský,
A. den Berg and
J. C. Eijkel
Integrated internal standards: A sample prep-free method for better precision in microchip CE
Integrated internal standards: A sample prep-free method for better precision in microchip CE
Electrophoresis,
40(5),
756-765,
2018