Journal Articles by A. C. Bidulock
A. C. Bidulock
P. Dubský
A. den Berg
J. C. Eijkel
Integrated internal standards: A sample prep-free method for better precision in microchip CE
Integrated internal standards: A sample prep-free method for better precision in microchip CE
Electrophoresis,
40(5),
756-765,
2018